When it comes to getting admission in a renowned Engineering college, you have to secure a good position in the Engineering Entrance Exams conducted all over India by different Engineering Institutes. If you are planning to sit for Engineering Entrance Exams, you have plenty of options to choose from.
While All India Engineering Entrance Examination and Joint Entrance Exam are considered among the most competitive Engineering entrance exams for the students seeking place in a reputed Engineering college, IIT Kanpur, IIT Kharagpur are among the several other popular entrance exams.
State Level Engineering Entrance Examinations (SLEEE) is also considered well recognized Engineering entrance exams.
Engineering Entrance Exam Application procedure
Engineering Entrance Exam Application Forms are generally collected either by post or you can download online application form from the official website of the institute. Some institutes also offer the privilege of online submission of Engineering Entrance Exam application forms.
If you have made Engineering Entrance Exam application online, you have to submit computer generated Engineering Entrance Exam Application Form along with the Demand Draft drawn in favor of that institute.
Correction in any particulars in the Engineering Entrance Exam Application Form is not allowed.
Incomplete Application Forms of the Engineering Entrance Exams are rejected.
Engineering Entrance Examination Patterns
Majority of the Engineering Entrance tests have two papers. The 1st paper of the Engineering Entrance Exam is generally segmented into three sections containing questions on Physics, Chemistry and Mathematics. The paper contains objective type questions for BE/B.Tech courses.
The 2nd paper tests you on Mathematics, Aptitude and drawing if you are applying for B. Architecture and B. Planning.
The Aptitude Test measures your perceptive power, observation and creative potential.
Engineering Entrance Exams
Some Engineering entrance exams under the category of Engineering entrance exams are described below: